Testing Superconductor Logic Integrated Circuits

نویسندگان

  • Arun A. Joseph
  • Hans G. Kerkhoff
چکیده

——Superconductor logic has the potential of extremely low-power consumption and ultra-fast digital signal processing. Unfortunately, the obtained yield of the present processes is low and specific faults occur. This paper deals with fault-modelling, Design-for-Test structures, and ATPG for these integrated circuits. Index Terms—— Fault modelling, Design-for-Test, Defect Monitor Structures, ATPG

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تاریخ انتشار 2011